Module 5
syllabus
Material Characterization Techniques and Instrumentation: 08 Hours Introduction to materials: Nanomaterials and nanocomposites. Principle, construction and working of X-ray Diffractometer, crystal size determination by Scherrer equation. Principle, construction, working and applications of -Atomic Force Microscope (AFM), X-ray Photoelectron Spectroscope (XPS), Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM) Numerical problems