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Module 5

syllabus

Material Characterization Techniques and Instrumentation: 08 Hours Introduction to materials: Nanomaterials and nanocomposites. Principle, construction and working of X-ray Diffractometer, crystal size determination by Scherrer equation. Principle, construction, working and applications of -Atomic Force Microscope (AFM), X-ray Photoelectron Spectroscope (XPS), Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM) Numerical problems